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> Electron Beam Gun Crucible Indexer
> FabGuard Suite
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> Quartz Monitor Crystals
> RF Sensing Technology with FabGuard
> Residual Gas Analyzers
>Thin Film Deposition Controllers/QCM
> Vacuum Components
> Vacuum Gauges
> Vacuum Valves and Gas Dosing Systems
Real-Time Crystal Frequency, Mass and Resistance Measurement
Table of Density and Acoustic Values
GC-15 Glass Cell
Well-suited for QCM experiments

Maxtek RQCM Quartz Crystal Microbalance Research System


Crystal Frequency, Mass and Resistance Measurement

RQCM is a highly advanced method of measuring film properties during processes such as deposition, dissolution or permeation. Up to three crystals can be measured simultaneously with <0.4 ng/cm 2 mass resolution. All data is logged and graphically displayed using integrated Windows®-based software in real time.

Features at a Glance
  • Measures up to three crystals simultaneously
  • <0.4 ng/cm 2 measurement resolution
  • Frequency range: 3.8 to 6 MHz, 5.1 to 10 MHz
  • Supports heavily loaded crystals
  • Capacitance cancellation
  • Electrically isolated crystal electrode
  • Onboard data acquisition
  • Control inputs and outputs
  • Integrated Windows-based software included

 Brochure - Maxtek RQCM Quartz Crystal Microbalance Research System
 Dynamically Adjusted Measurement Update Rate
 Maxtek Crystal Holders/Flow Cell/Glass Cell Brochure
 Maxtek RQCM Software (v2.0)
 RQCM Software; Run-Time Error '35603': Invalid Key
 RS-232 Communications Checklist

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