Thin Film Deposition Controllers/QCM Measurement Instruments
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薄膜沉積控制器
市場領先的 INFICON 薄膜沉積控制器和監控器以卓越的測量速度和精度控制沉積速率和最複雜過程的持續時間。增强型軟件和邏輯 I/O 功能使 INFICON 薄膜沉積控制器能够完全集成到真空系統中以實現自動過程控制。對于簡單一些的過程，使用經濟的 INFICON 精度控制器和監控器，可使薄膜測量的精度達到傳統技術的 100 倍。
所有使用我公司專利測量系統 ModeLock 的 INFICON 石英儀器都已成爲現有的最高級儀器。
INFICON 高級石英晶體具有相當高的穩定性，可成功處理上百萬次。利用 5 或 6 MHz 的金或銀電極，INFICON 晶體具有 100% 原廠測試的質量保證。
Cygnus 薄膜沈積控制器
OLED 應用中的最大吞吐量
IC/5 薄膜沈積控制器
用于增强型過程控制集成的新型薄膜沉積控制器
XTC/C 薄膜沈積控制器
創建您自己的軟件界面
XTC/2 薄膜沈積控制器
功能强大且易于使用
XTM/2 薄膜監控器
杰出的性能與價格
傳感器和饋入件組
經證實可靠的質量和耐用性
石英晶體
最大使用壽命、穩定性、精確性和易用性
INFICON market-leading thin film deposition controllers, monitors and QCM measurement instruments control deposition rate and thickness of the most complex processes with unsurpassed measurement speed and precision. Enhanced software and logic I/O features allow the our thin film deposition controllers/QCM measurement instruments to be fully integrated into the vacuum system for automatic process control. To control less complex processes, use INFICON economical, precision controllers, monitors and QCM measurement instruments that measure films with 100 times more precision than conventional techniques.
Most INFICON crystal-based instruments use our patented measurement system, ModeLock, making them the most advanced instruments available.
More information about our thin film deposition/QCM instruments.
Learn about RQCM Instruments
Browse our complete line of INFICON Thin Film Deposition Controllers, Monitors, QCM Instrumention, and Accessories:
Controllers
Monitors
RQCM
Software
Sensors and Feedthroughs
Crystals
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Thin Film Deposition Controllers, Monitors and Accessories Catalog
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