MAKING EXCELLENCE REPEATABLE
Feature-Rich IC6 Provides the Best Measurement Precision Possible
The IC6 Thin Film Deposition Controller provides exceptional value by combining the proven performance of INFICON thin film controllers with unique features, all designed for you to achieve the most from your position process. The IC6 uses our ModeLock frequency measurement system to provide stable, high-resolution rate and thickness measurement with an industry-leading rate resolution of .00433 A/s every 1/10 second. No other quartz crystal controller has the performance, quality, and features of the IC6, allowing you to make excellence repeatable.
Features at a Glance
- INFICON ModeLock technology ensures the most stable, highest resolution rate and thickness measurement available, even at very low rates.
- Auto Z improves thickness accuracy b automatically determining the Z-ratio as material is deposited
- Up to six sources can be controlled simultaneously, independently or in any combination by one IC6, relieving the need for two or three controllers
- Color TFT LCD display makes it easy to see what's going on with your process
- 10 Hz measurement
- +/-0.0035 Hz over 100ms sample
- USB data storage for screen shots, recipe storage and data logging
- Thickness summing of multiple sources
- Measurement rate averaging for low density, very low rate materials (up to 30 seconds for use with stable sources for very low rate OLED dopant material deposition)
- Display rate resolution of up to 0.001/s
- 4 meter XIU option provides the ability to use long in-vacuum sensor cables for large systems
- Non-deposit control allows for continuous source control as substrates are cycled through the deposition chamber
- 6 DAC outputs standard, 6 additional optional for source control, rate or thickness monitoring
- Optional Ethernet communications
- RoHS compliant
ASSOCIATED TECHNICAL INFORMATION
Brochures and Datasheets:
|
Brochure - Crystal 12 Sensor for Quartz Crystal Deposition Controllers
English
|
|
Brochure - IC6 Thin Film Deposition Controller for Optical Applications
English
|
Catalogs:
|
Catalog - Thin Film Deposition Controllers, Monitors and Accessories
English
| Chinese
|
Operations and Maintenance Manuals:
Technical Information:
|
Application Note - Auto-Z: A Path to Precise Control of Layer Thickness
English
|
|
Mass Determination with Piezoelectric Quartz Crystal Resonators
English
|
|
Reducing Process Variation Through Multiple Point Crystal Sensor Monitoring
English
|
|
Technical Note - The Technology of the Intelligent Oscillator for Quartz Crystal Measurement and Advantages for Thin Film Processes
English
|
|
 | | Learn more about the IC6 for Optical Applications |
|  | | Crystal 12 - Replaces crystals automatically without interrupting your process. |
|  | | Table of Density and Z-Ratio Values |
|
|
|