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薄膜沉积控制器
市场领先的 INFICON 薄膜沉积控制器和监控器以卓越的测量速度和精度控制沉积速率和最复杂过程的持续时间。增强型软件和逻辑 I/O 功能使 INFICON 薄膜沉积控制器能够完全集成到真空系统中以实现自动过程控制。对于简单一些的过程，使用经济的 INFICON 精度控制器和监控器，可使薄膜测量的精度达到传统技术的 100 倍。
所有使用我公司专利测量系统 ModeLock 的 INFICON 石英仪器都已成为现有的最高级仪器。
INFICON 高级石英晶体具有相当高的稳定性，可成功处理上百万次。利用 5 或 6 MHz 的金或银电极，INFICON 晶体具有 100% 原厂测试的质量保证。
Cygnus 薄膜沉积控制器
OLED 应用中的最大吞吐量
IC/5 薄膜沉积控制器
用于增强型过程控制集成的新型薄膜沉积控制器
XTC/C 薄膜沉积控制器
创建您自己的软件界面
XTC/2 薄膜沉积控制器
功能强大且易于使用
XTM/2 薄膜监控器
杰出的性能与价格
传感器和馈入件组
经证实可靠的质量和耐用性
石英晶体
最大使用寿命、稳定性、精确性和易用性
 | | Quality Quartz Crystals at Great Prices |
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INFICON market-leading thin film deposition controllers, monitors and QCM measurement instruments control deposition rate and thickness of the most complex processes with unsurpassed measurement speed and precision. Enhanced software and logic I/O features allow the our thin film deposition controllers/QCM measurement instruments to be fully integrated into the vacuum system for automatic process control. To control less complex processes, use INFICON economical, precision controllers, monitors and QCM measurement instruments that measure films with 100 times more precision than conventional techniques.
Most INFICON crystal-based instruments use our patented measurement system, ModeLock, making them the most advanced instruments available.
More information about our thin film deposition/QCM instruments.
Learn about INFICON Maxtek RQCM Instruments
Browse our complete line of INFICON and INFICON Maxtek Thin Film Deposition Controllers, Monitors, QCM Instrumention, and Accessories:
Controllers
Monitors
Oscillators
RQCM
Software
Sensors and Feedthroughs
Crystals
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