晶体频率、质量和阻力测量
RQCM 一种非常先进的方法，用于测量薄膜在沉积、溶解或渗透过程中的性能。 最多可以同时测量 3 颗晶体，质量分辨率小于 0.4 ng/cm ^2^。 所有数据都使用集成的基于 Windows 的软件实时加以记录并以图形显示。
功能概览
- 最多同时测量 3 颗晶体
- 测量分辨率小于 0.4 ng/cm 2
- 频率范围： 3.8 - 6 MHz、5.1 - 10 MHz
- 支持重荷晶体
- 电容消除
- 电绝缘晶体电极
- 板载数据采集
- 控制输入和输出
- 包括基于 Windows 的集成式软件
ASSOCIATED TECHNICAL INFORMATION
Brochures and Datasheets:
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Brochure - Maxtek Crystal Holders/Flow Cell/Glass Cell
English
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Brochure - Maxtek RQCM Quartz Crystal Microbalance Research System
English
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Brochure - Research Crystals
English
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Operations and Maintenance Manuals:
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Instruction Sheet - How to Install a Crystal
English
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Instruction Sheet - Probe Maintenance
English
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Maintenance and Installation Manual - CHC-15 Crystal Holders, GC-15 Glass Cell Cell
English
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Operating Manual - RQCM Quartz Crystal Microbalance Research System
English
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Technical Information:
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Dynamically Adjusted Measurement Update Rate
English
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RQCM Software; Run-Time Error '35603': Invalid Key
English
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Technical Note: Communications Checklist - RS-232
English
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 | | Real-Time Crystal Frequency, Mass and Resistance Measurement |
|  | | Table of Density and Acoustic Values |
|  | GC-15 Glass Cell
Well-suited for QCM experiments |
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